Encyclopedia > N > Neutron depth profiling
Neutron depth profiling
Neutron depth profiling (NDP) is a near-surface analysis technique that is commonly used to obtain profiles of concentration as a function of depth for certain technologically important light elements in nearly any substrate. The technique was first proposed by Ziegler et al [1] to determine the concentration profiles of boron impurities in silicon substrates, and later improved by Biersack and coworkers to much of its existing capabilities.
Information are taken from Wikipedia, the open encyclopedia, to which contribute many volunteers from around the whole world. Texts are available under the following conditions GNU Free Documentation License.
Encyklopedie (cz) Encyklopédia (sk) Enzyklopädie (de)