Encyclopedia > W > Wafer testing
Wafer testing
Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them.
Information are taken from Wikipedia, the open encyclopedia, to which contribute many volunteers from around the whole world. Texts are available under the following conditions GNU Free Documentation License.
Encyklopedie (cz) Encyklopédia (sk) Enzyklopädie (de)